X-ray imaging and computer modeling help map electric properties of nanomaterials

Researchers have developed a new approach for studying piezoelectric materials using ultrafast 3-D X-ray imaging and computer modeling. Their integrated approach can help us better understand material behavior and engineer more powerful and energy-efficient technologies.

(via WSJ)

---

Follow Arabian Post

Select Arabian Post as your preferred source on Google and MSN News for trusted business news and Arab politics and updates.

---

Notice an issue?

Arabian Post strives to deliver the most accurate and reliable information to its readers. If you believe you have identified an error or inconsistency in this article, please don't hesitate to contact our editorial team at editor[at]thearabianpost[dot]com. We are committed to promptly addressing any concerns and ensuring the highest level of journalistic integrity.

---